Title :
Analysis of puncturing pattern for high rate turbo codes
Author :
Mo, Fan ; Kwatra, S.C. ; Kim, Junghwan
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Toledo Univ., OH, USA
fDate :
6/21/1905 12:00:00 AM
Abstract :
Turbo codes have performance superior than all other coding techniques. The main factors that make turbo codes so efficient include, parallel concatenation structure of the encoding system, recursive convolutional encoder, interleaver, puncturing pattern and iterative decoding. In this research, we have investigated the effect of the puncturing pattern on the performance of high rate turbo codes. Based on simulation results, we claim that for most of the code rates, when a pseudo random interleaver is applied, the selection of puncturing pattern does not have significant effect on the code performance. However, for some rates, a commonly used puncturing patterns does cause much poorer performance. For these rates, a modified puncturing pattern is proposed which restores the performance back to the Shannon limit
Keywords :
concatenated codes; convolutional codes; interleaved codes; iterative decoding; turbo codes; Shannon limit; high rate turbo codes; iterative decoding; parallel concatenation structure; pseudo random interleaver; puncturing pattern; recursive convolutional encoder; Bit error rate; Computer science; Convolutional codes; Error correction; Iterative decoding; NASA; Pattern analysis; Turbo codes;
Conference_Titel :
Military Communications Conference Proceedings, 1999. MILCOM 1999. IEEE
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-5538-5
DOI :
10.1109/MILCOM.1999.822742