Title :
TRE signal processing by positive photon discrimination
Author :
Desplats, R. ; Beaudoin, Felix ; Perdu, P.
Author_Institution :
CNES-Thales Lab. French Space Agency, Toulouse, France
Abstract :
IC debug is facilitated with time resolved photon emission. Latest technologies are now working at ultra low power supply voltages, <1 V. At such voltages, background noise begins to mask commutation peaks, thus biasing the analysis. With the positive photon discrimination approach, signal is extracted even below the noise level.
Keywords :
integrated circuit noise; integrated circuit reliability; integrated circuit testing; low-power electronics; luminescence; time resolved spectra; 1 V; IC debug; TRE signal processing; background noise masked commutation peaks; noise level; positive photon discrimination; signal extraction; time resolved photon emission; ultra low power supply voltages; Hot carriers; Noise level; Photonic band gap; Photonic integrated circuits; Semiconductor device noise; Signal processing; Signal resolution; Silicon; Space technology; Testing;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the
Print_ISBN :
0-7803-8454-7
DOI :
10.1109/IPFA.2004.1345619
