DocumentCode
1614316
Title
TRE signal processing by positive photon discrimination
Author
Desplats, R. ; Beaudoin, Felix ; Perdu, P.
Author_Institution
CNES-Thales Lab. French Space Agency, Toulouse, France
fYear
2004
Firstpage
263
Lastpage
266
Abstract
IC debug is facilitated with time resolved photon emission. Latest technologies are now working at ultra low power supply voltages, <1 V. At such voltages, background noise begins to mask commutation peaks, thus biasing the analysis. With the positive photon discrimination approach, signal is extracted even below the noise level.
Keywords
integrated circuit noise; integrated circuit reliability; integrated circuit testing; low-power electronics; luminescence; time resolved spectra; 1 V; IC debug; TRE signal processing; background noise masked commutation peaks; noise level; positive photon discrimination; signal extraction; time resolved photon emission; ultra low power supply voltages; Hot carriers; Noise level; Photonic band gap; Photonic integrated circuits; Semiconductor device noise; Signal processing; Signal resolution; Silicon; Space technology; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the
Print_ISBN
0-7803-8454-7
Type
conf
DOI
10.1109/IPFA.2004.1345619
Filename
1345619
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