DocumentCode
1614551
Title
Dual-DLL-based CMOS all-digital temperature sensor for microprocessor thermal monitoring
Author
Woo, Kyoungho ; Meninger, Scott ; Xanthopoulos, Thucydides ; Crain, Ethan ; Ha, Dongwan ; Ham, Donhee
Author_Institution
Harvard Univ., Cambridge, MA, USA
fYear
2009
Firstpage
68
Abstract
Microprocessors increasingly need on-chip temperature sensors for thermal and power management. Since these sensors do not take part in the main computing activity but rather play the auxiliary, albeit important, role of temperature monitoring, their presence in terms of area, power, and design effort should be minimal, thus, all-digital sensors are desired. Temperature sensing based on temperature-dependent delays of inverters could be suited for microprocessor applications, as it lends itself to digital implementation: by using a time-to-digital converter (TDC), an inverter delay can be compared to an absolute delay reference and converted to a digital temperature output. We report on an all-digital CMOS temperature sensor for microprocessor application, which also exploits temperature-dependent inverter delays within the TDC-based framework. It, however, has two improvements over prior art. First, it removes the effect of process variation on inverter delays via calibration at one temperature point (instead of 2-point calibration), thus, reducing high volume production cost. Second, we use two fine-precision DLLs, one to synthesize a set of temperature-independent delay references in a closed loop, the other as a TDC to compare temperature-dependent inverter delays to the references. The use of DLLs simplifies sensor operation and yields a high measurement bandwidth (5 kS/s) at 7b resolution, which could enable fast temperature tracking.
Keywords
CMOS digital integrated circuits; delay lock loops; microprocessor chips; temperature measurement; temperature sensors; CMOS all-digital temperature sensor; complementary metal-oxide semiconductor; delay-locked loop; digital implementation; dual-DLL; microprocessor thermal monitoring; temperature-dependent inverter delay; time-to-digital converter; Art; Calibration; Delay; Energy management; Inverters; Microprocessors; Monitoring; Temperature measurement; Temperature sensors; Thermal management;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference - Digest of Technical Papers, 2009. ISSCC 2009. IEEE International
Conference_Location
San Francisco, CA
Print_ISBN
978-1-4244-3458-9
Type
conf
DOI
10.1109/ISSCC.2009.4977311
Filename
4977311
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