• DocumentCode
    1614611
  • Title

    A 1.8V 1.0GS/s 10b self-calibrating unified-folding-interpolating ADC with 9.1 ENOB at Nyquist frequency

  • Author

    Taft, R.C. ; Francese, Pier Andrea ; Tursi, M.R. ; Hidri, O. ; Mackenzie, Allen ; Hoehn, T. ; Schmitz, Paul ; Werker, H. ; Glenny, A.

  • Author_Institution
    Nat. Semicond., Unterhaching, Germany
  • fYear
    2009
  • Firstpage
    78
  • Abstract
    An advance in folding-interpolating ADCs is presented that simplifies their extension to higher resolution by building the converter out of identical but scaled pipelined cascaded folding stages. The limitation of the classical folding architecture is the separate coarse channel to determine which fold an input signal is in. Higher-resolution ADCs benefit from a higher order of folding, which results in more closely spaced folds and makes the alignment between this "fine" channel and the "coarse" channel increasingly difficult due to offset and settling mismatch. In this paper we eliminate this separate coarse channel using instead a single "unified" set of cascaded folding stages, in which each folding stage acts as the coarse channel for the following folding stage. This extends previous work where the coarse channel is distributed and where the cascaded folding stages are pipelined. Our approach is demonstrated in a dual 1.8 V 1.0 GS/s 10 b ADC that achieves plusmn0.2 LSB DNL and 9.1 ENOB at Nyquist while consuming 1.2 W/channel.
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; calibration; cascade networks; interpolation; CMOS design; ENOB; Nyquist frequency; cascaded folding stages; coarse channel; self-calibrating unified-folding-interpolating ADC; voltage 1.8 V; word length 10 bit; Calibration; Clocks; Degradation; Equations; Error correction; Frequency conversion; Frequency estimation; Jitter; Linearity; Solid state circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference - Digest of Technical Papers, 2009. ISSCC 2009. IEEE International
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    978-1-4244-3458-9
  • Type

    conf

  • DOI
    10.1109/ISSCC.2009.4977316
  • Filename
    4977316