Title :
γ-radiation dosimetry using screen printed nickel oxide thick films
Author :
Arshak, K. ; Korostynska, O. ; Harris, J.
Author_Institution :
Dept. of Electron. & Comput. Eng., Limerick Univ., Ireland
fDate :
6/24/1905 12:00:00 AM
Abstract :
Thick films of nickel oxide (NiO) were investigated for γ-radiation dosimetry purposes. Samples were fabricated using the thick film screen printing technique. Absorption spectra for NiO films were recorded and the values of the optical band gap for as-printed, irradiated and annealed films were calculated. It was found that the optical band gap value decreased as the radiation dose was increased. Samples with an Ag-NiO-Ag sandwich structure were exposed to a 60 Co γ-radiation source at a dose rate of 6 Gy/min. The relative change in current increased linearly with increased dosage up to 720 Gy. The I-V characteristics indicated a Poole-Frenkel conduction mechanism. It was found that annealing restored both the electrical and the optical properties of the samples
Keywords :
MIM structures; Poole-Frenkel effect; annealing; dosimetry; energy gap; gamma-ray detection; nickel compounds; optical constants; radiation monitoring; silver; thick film devices; thick films; γ-radiation dosimetry; 0 to 720 Gy; Ag-NiO-Ag; I-V characteristics; Poole-Frenkel conduction mechanism; absorption spectra; annealed films; optical band gap; sandwich structure; screen printed thick films; Annealing; Dosimetry; Electromagnetic wave absorption; Nickel; Optical films; Optical recording; Photonic band gap; Printing; Sandwich structures; Thick films;
Conference_Titel :
Microelectronics, 2002. MIEL 2002. 23rd International Conference on
Conference_Location :
Nis
Print_ISBN :
0-7803-7235-2
DOI :
10.1109/MIEL.2002.1003210
