Title :
Boolean Difference Technique for Detecting All Missing Gate Faults in Reversible Circuits
Author :
Mondal, Joyati ; Mondal, Bappaditya ; Kole, Dipak ; Rahaman, Hafizur ; Das, Debesh K.
Author_Institution :
Dept. of Comput. Sci. & Eng., Jadavpur Univ., Kolkata, India
Abstract :
Quantum reversible circuit is a new emerging technology attracting the researchers. A reversible circuit is composed of reversible gates only. A reversible Toffoli gate has two components - the control and the target. The missing gate fault model is used for modelling defects in quantum k-CNOT gate. This work introduces Boolean Difference technique for deriving the test set for detecting all faults in a reversible circuit implemented with k-CNOT gates. Then a optimizing algorithm is used to derive optimal test set to detect all possible partial missing faults in a circuit.
Keywords :
logic circuits; logic gates; quantum computing; Boolean difference technique; missing gate fault model; quantum reversible circuit; reversible Toffoli gate; reversible circuits; Arrays; Computer science; Electrical fault detection; Fault detection; Integrated circuit modeling; Logic gates; Missing-gate fault; quantum computing; reversible logic; test generation;
Conference_Titel :
Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2015 IEEE 18th International Symposium on
Conference_Location :
Belgrade
Print_ISBN :
978-1-4799-6779-7
DOI :
10.1109/DDECS.2015.43
