Title :
Experimental Comparison of Time-of-Flight Mass-Analysis with Magnetic Mass-Analysis
Author :
Gushenets, Vasily I. ; Bugaev, Alexey S. ; Oks, Efim M. ; Hershcovitch, Ady ; Kulevoj, Timur V. ; Brown, Ian G.
Author_Institution :
Russian Acad. of Sci., Tomsk
Abstract :
Summary form only given. It is common for ion-beam-based fields of research and industry that magnetic analysis is used for ion species separation. For ion beam characterization the bending magnet has also preference to alternative methods, on the assumption that magnetic analysis is more reliable and accurate. We have carried out a series of experiments in which we used both a magnetic mass-separator and a time-of-flight (TOF) analyzer for ion mass spectra determination. The TOF analyzer is of more-or-less conventional design and is a detachable device that provides rapid analysis of charge-to-mass composition of moderate energy ion beams. The magnetic analyzer is a massive device using a 90deg sector analysis magnet with radius of the central orbit 35 cm. A significant result of this work is that, for the same experimental conditions, the mass spectra results obtained using the magnetic mass-separator and the time-of-flight analyzer are in good agreement.
Keywords :
electromagnetic devices; ion beams; magnetic separation; mass spectrometers; time of flight mass spectroscopy; TOF analyzer; bending magnet; charge-mass composition; ion beam characterization; ion beams; ion mass spectra determination; ion species separation; magnetic mass analysis; magnetic mass separator; time of flight mass analysis; Electronics industry; Industrial electronics; Ion beams; Laboratories; Magnetic analysis; Magnetic devices; Magnetic separation; Physics; Time series analysis; US Department of Energy;
Conference_Titel :
Plasma Science, 2007. ICOPS 2007. IEEE 34th International Conference on
Conference_Location :
Albuquerque, NM
Print_ISBN :
978-1-4244-0915-0
DOI :
10.1109/PPPS.2007.4345518