Title :
A Fitting Model for High Current Density Field Emission Arrays
Author_Institution :
Fu Jen Catholic Univ., Taipei
Abstract :
Summary form only given. We have developed a new method for fitting the current-voltage (I-V) characteristics of the field emission arrays (FEAs) that may be operated at high current density. In recent experiments of FEAs, the Fowler-Nordheim (FN) plots show that the experimental results are apart from the conventional FN fits. Based on the past studies, it is taken for granted that the cause of the current saturation by space charge effects can be excluded at these comparatively lower current density levels. In this work, the FN equation is modified with a global effective work function which is an ensemble average of the local effective work function of individual tips. Within the framework of the effective work function approximation, a self-consistent FN equation including the space charge effects of the field emission electrons has been verified by the 2D finite-difference time-domain particle-in-cell simulation and compared with the experiments performed at Stanford Research Institute, giving excellent agreement. The self-consistent model is demonstrated to be a good fit to the I-V characteristics of high current density FEAs. This also indicates that the space charge effects play an essential role in the saturation behavior of FEAs.
Keywords :
current density; field emission; field emitter arrays; finite difference time-domain analysis; plasma diodes; space charge; work function; 2D finite-difference time-domain particle-in-cell simulation; Fowler-Nordheim plots; current saturation; current-voltage characteristics; effective work function; field emission electrons; high current density field emission arrays; space charge effects; Anodes; Current density; Diodes; Electron emission; Equations; Finite difference methods; Function approximation; Laboratories; Space charge; Time domain analysis;
Conference_Titel :
Plasma Science, 2007. ICOPS 2007. IEEE 34th International Conference on
Conference_Location :
Albuquerque, NM
Print_ISBN :
978-1-4244-0915-0
DOI :
10.1109/PPPS.2007.4345533