Influence of morphology on dielectric properties of PEN

The polyethylene naphthalene 2,6 dicarboxylate (PEN) is a biaxially oriented polymer film which can be manufactured to ultra thin thickness retaining all its important properties, thereby making it an excellent candidate for capacitor applications. The condensers undergo local heating in the implantation process as well as in SMT (surface mounted technology). Also, during their use, problems of overload in various applications, such as high frequency power conversion or input and output filtering can cause the same. A significant rise in temperature can cause changes of structure and morphology which is often at the origin of electrical system failure, if the operational nominal parameters are disturbed. From this point of view, a coupling of two techniques of characterization, differential scanning calorimetry and dynamic electrical analysis, was carried out. The analyses of the dielectric losses and the relaxation phenomena are interesting measures to appreciate the structural status of the material and the variation of the medium composition due to an annealing process