Title :
Generic Self Repair Architecture with On-Line Fault Diagnosis
Author :
Kristofik, Stefan ; Balaz, Marcel ; Fischerova, Maria
Author_Institution :
Inst. of Inf., Bratislava, Slovakia
Abstract :
Ever smaller nanotechnologies introduce new types of defects and fault mechanisms with negative influence on system on-chips (SoCs) reliability and operational life. This paper presents a fault diagnosis and repair procedure which is implemented into generic built-in self-repair architecture. The procedure utilizes on-line fault detection whereas repair is performed during off-line mode. Experimental results show quicker repair process and area overhead which is well below the additional area of triple modular redundancy system.
Keywords :
built-in self test; fault diagnosis; integrated circuit reliability; logic circuits; system-on-chip; generic self repair architecture; on-line fault detection; on-line fault diagnosis; system on-chips reliability; triple modular redundancy system; Circuit faults; Fault detection; Fault diagnosis; Maintenance engineering; Switches; Testing; Tunneling magnetoresistance; Built-in self-repair; logic core; on-line testing; reconfigurable logic; reliability; system-on-chip;
Conference_Titel :
Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2015 IEEE 18th International Symposium on
Conference_Location :
Belgrade
Print_ISBN :
978-1-4799-6779-7
DOI :
10.1109/DDECS.2015.58
