DocumentCode :
1615711
Title :
SVM-based Multi-textural Image Classification and its Uncertainty Analysis
Author :
Zeng, Yu ; Zhang, Jixian ; van Genderen, J.L. ; Wang, Guangliang
Author_Institution :
Chinese Acad. of Surveying & Mapping, Beijing, China
fYear :
2012
Firstpage :
1316
Lastpage :
1319
Abstract :
Texture analysis, a hot issue in image processing, is a key technique for ground surface object recognition. This paper presents a supervised image classification method based on multiple and multi-scale texture features and support vector machines (SVM). By taking different scales of ground surface features into account, and by feature fusion technique, this method integrates seven-dimensional texture features of different characteristics from GLCM and fractal theory to realize the land use/cover classification. The seven features combine the abilities to describe image textures of different approaches, which can reach better classification performance than any of them and significantly improves the precision of automatic image interpretation. Classification uncertainty is also evaluated and analyzed at the scale of pixel using the extended probability vector and probability entropy model. The imagery used in this research is RADARSAT-1 SAR data.
Keywords :
entropy; feature extraction; fractals; geophysical image processing; image classification; image fusion; image texture; land use planning; object recognition; probability; radar imaging; support vector machines; synthetic aperture radar; terrain mapping; uncertainty handling; vectors; GLCM; RADARSAT-1 SAR data; SVM-based multitextural image classification; automatic image interpretation; classification uncertainty analysis; feature fusion technique; fractal theory; ground surface features; ground surface object recognition; image processing; land use-cover classification; multiscale texture features; probability entropy model; probability vector; seven-dimensional texture features; supervised image classification method; support vector machines; texture analysis; Accuracy; Entropy; Fractals; Standards; Support vector machine classification; Uncertainty; Extended Probability Vector; Fractal; Grey Level Co-occurrence Matrix; Support Vector Machines; Texture analysis; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Control and Electronics Engineering (ICICEE), 2012 International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4673-1450-3
Type :
conf
DOI :
10.1109/ICICEE.2012.349
Filename :
6322638
Link To Document :
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