DocumentCode
1615840
Title
Recent innovations in DRAM manufacturing
Author
James, Dick
Author_Institution
Chipworks Inc., Ottawa, ON, Canada
fYear
2010
Firstpage
264
Lastpage
269
Abstract
Recent generations of Dynamic Random Access Memory (DRAM) have seen remarkable changes in both processes and the materials used. In the past five years the industry has gone from the 9x-nm node through the 7x, 6x, and 5x nodes to the 4x node chips starting to come on the market. In retrospect it is little short of amazing that the competing companies have crammed the required ~25 fF into an ever decreasing amount of floorspace; the cell size of the latest 4x-nm DRAM is ~0.0137 μm2 - or maybe we should say ~13,700 nm2. This has been achieved by the adoption of dual-layer capacitors, high-k dielectrics, and raised source/drains, among other techniques. Chipworks, as a supplier of competitive intelligence to the semiconductor and electronics industries, monitors the evolution of chip technologies as they come into commercial production. Chipworks has obtained parts from the leading edge manufacturers, and performed structural and compositional analyses to examine the features and manufacturing processes of the devices. This paper illustrates some of the different structures of DRAM cells seen in the last few years from some of the leading companies in the sector, ranging from the 9x-nm node to the latest 4x-nm product.
Keywords
DRAM chips; integrated circuit manufacture; manufacturing processes; Chipworks; DRAM cells; DRAM manufacturing; chip technology; commercial production; competitive intelligence; compositional analysis; dual-layer capacitor; dynamic random access memory; electronics industry; high-k dielectrics; manufacturing process; semiconductor industry; structural analysis; Arrays; Capacitors; SDRAM; Tin; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Manufacturing Conference (ASMC), 2010 IEEE/SEMI
Conference_Location
San Francisco, CA
ISSN
1078-8743
Print_ISBN
978-1-4244-6517-0
Type
conf
DOI
10.1109/ASMC.2010.5551462
Filename
5551462
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