• DocumentCode
    1615871
  • Title

    Breakdown characteristics of different grades of CVD diamond samples

  • Author

    Lebey, T. ; Malec, D. ; Dutarde, E.

  • Author_Institution
    LGET/UPS, Toulouse, France
  • fYear
    2001
  • fDate
    6/23/1905 12:00:00 AM
  • Firstpage
    208
  • Lastpage
    210
  • Abstract
    500μm thickness CVD diamond samples of different grades related to the sp2/sp3 phase ratio and able to be used as substrates in power electronic applications have been characterized. The following conclusions may be drawn: breakdown and resistivity values of thick CVD diamond are far from the ones claimed for thin film (~MV/cm). and for the natural materials (~10 MV/cm) Samples presenting the largest amount of nitrogen behave from an electrical point of view better than pure "undoped" diamond samples
  • Keywords
    CVD coatings; diamond; electric breakdown; electric strength; electrical resistivity; power electronics; 500 micron; C; CVD samples; breakdown; diamond; power electronic applications; resistivity values; sp2/sp3 phase ratio; Chemical vapor deposition; Electric breakdown; Frequency; Grain boundaries; Performance evaluation; Phase measurement; Power electronics; Semiconductor materials; Switches; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid Dielectrics, 2001. ICSD '01. Proceedings of the 2001 IEEE 7th International Conference on
  • Conference_Location
    Eindhoven
  • Print_ISBN
    0-7803-6352-3
  • Type

    conf

  • DOI
    10.1109/ICSD.2001.955593
  • Filename
    955593