DocumentCode
1615933
Title
Improving reliability in VLSI systems through redundant modules
Author
Prasad, Vinod B. ; Hoadley, Chris
Author_Institution
Bradley Univ., Peoria, IL, USA
fYear
1992
Firstpage
1361
Abstract
The proposed method of improving reliability through redundant modules may easily be applied to many different types of systems. For purposes of illustration, the proposed method is demonstrated on array processors. An overview of array processors, with particular emphasis on the multiply accumulate module, and their applications provides the motivation for the study of increased reliability. Array processors inherently have a large amount of parallelism, which makes reliable design that much more important. A comparison of the proposed system´s performance to that of the non-redundant system is made. Computer simulation results at the transistor and logic gate level are used in evaluating the overall performance of the two systems
Keywords
VLSI; cellular arrays; circuit reliability; fault tolerant computing; microprocessor chips; parallel architectures; redundancy; VLSI systems; array processors; multiply accumulate module; redundant modules; reliability; Application software; Array signal processing; Computer simulation; Costs; Hazards; Logic gates; Parallel processing; Sequential circuits; System performance; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1992., Proceedings of the 35th Midwest Symposium on
Conference_Location
Washington, DC
Print_ISBN
0-7803-0510-8
Type
conf
DOI
10.1109/MWSCAS.1992.271087
Filename
271087
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