Title :
A comparison of microstrip line discontinuity models with measured data
Author :
Johnston, Ronald H. ; Yang, Ming
Author_Institution :
Dept. of Electr. & Comput. Eng., Calgary Univ., Alta., Canada
Abstract :
A number of circuit models have been published to represent the circuit properties of microstrip line discontinuities such as corners and tees. Measured scattering parameter data of these discontinuities are compared with scattering parameters derived from lumped element models. Measurement methods and equivalent circuit models are discussed. An alternative method of deriving scattering parameter data for discontinuities with arbitrary dimensions and dielectric constants is presented
Keywords :
S-parameters; equivalent circuits; microstrip components; microstrip lines; waveguide theory; corners; equivalent circuit models; lumped element models; microstrip line discontinuity models; scattering parameter data; tees; Circuit analysis computing; Connectors; Distributed parameter circuits; Equivalent circuits; Inductors; Microstrip; Scattering parameters; Transmission line discontinuities; Transmission line measurements; Transmission line theory;
Conference_Titel :
Circuits and Systems, 1992., Proceedings of the 35th Midwest Symposium on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-0510-8
DOI :
10.1109/MWSCAS.1992.271093
