DocumentCode
1616303
Title
A model for power-supply noise injection in long interconnects
Author
Saint-Laurent, Martin ; Swaminathan, Madhavan
Author_Institution
Intel Corp., Austin, TX, USA
fYear
2004
Firstpage
113
Lastpage
115
Abstract
For long interconnects, the power-supply noise injected through the repeaters can be more critical than crosstalk simply because there is no easy way to get rid of it. This paper rigorously analyzes the injection mechanism using a novel device model. A closed-form expression quantifying the interconnect delay variations caused by the noise is derived. For typical 130-nm interconnects, the model is shown to be very accurate.
Keywords
integrated circuit interconnections; integrated circuit noise; nanotechnology; 130 nm; closed-form expression; crosstalk; injection mechanism analysis; interconnect delay variations; long interconnects; power-supply noise injection; repeaters; Closed-form solution; Crosstalk; Delay; Differential equations; Integrated circuit interconnections; Integrated circuit noise; Repeaters; Threshold voltage; Timing; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Interconnect Technology Conference, 2004. Proceedings of the IEEE 2004 International
Print_ISBN
0-7803-8308-7
Type
conf
DOI
10.1109/IITC.2004.1345709
Filename
1345709
Link To Document