Title :
Feedback bridging fault detection using current monitoring
Author :
Lu, Ding ; Tong, Carol Q.
Author_Institution :
Dept. of Electr. Eng., Colorado State Univ., Ft. Collins, CO, USA
Abstract :
Feedback bridging faults in CMOS circuits are difficult to detect by monitoring logic values. The authors study the possibility of detecting feedback bridging faults by using current monitoring. It is shown that by monitoring current, the feedback bridging faults that cause a metastable state can be detected. Using the same method, the feedback bridging faults can also be detected that lead to oscillations assuming the propagation delay is small
Keywords :
CMOS integrated circuits; fault location; feedback; integrated circuit testing; logic testing; CMOS circuits; current monitoring; fault detection; feedback bridging faults; logic faulty behaviour; metastable state; CMOS logic circuits; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Feedback circuits; Monitoring; Propagation delay; Semiconductor device modeling; State feedback;
Conference_Titel :
Circuits and Systems, 1992., Proceedings of the 35th Midwest Symposium on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-0510-8
DOI :
10.1109/MWSCAS.1992.271103
