Title :
High-resolution analog measurement on mixed signal LSI tester
Author :
Akiyama, Kohei ; Nishimura, Hiroshi ; Anazawa, Kyoji ; Kishida, Akito ; Kasuga, Nobuyuki
Author_Institution :
Yokogawa Hewlett-Packard, Tokyo, Japan
Abstract :
The authors describe the HP 9480, a mixed-signal LSI tester featuring LF source/measurement modules capable of measurements on the order of 100 dB for standard dynamic range, signal-to-noise ratio, or total harmonic distortion measurements. To realize this tester, background noise was minimized by using a unique power supply system and proper ground management, and several function modules were developed. The authors describe the noise reduction techniques and functional modules. Measurement examples are also given
Keywords :
Hewlett Packard computers; automatic test equipment; electric distortion measurement; electric noise measurement; electronic equipment testing; large scale integration; modules; HP 9480; LF source/measurement modules; background noise; function modules; mixed signal LSI tester; noise reduction; signal-to-noise ratio; standard dynamic range; total harmonic distortion measurements; Background noise; Distortion measurement; Dynamic range; Energy management; Large scale integration; Measurement standards; Power supplies; Signal to noise ratio; System testing; Total harmonic distortion;
Conference_Titel :
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location :
Washington, DC
DOI :
10.1109/TEST.1989.82286
