DocumentCode
1616657
Title
Monte-Carlo analysis of measurement uncertainties for on-wafer Short-Open-Load-Reciprocal calibrations
Author
Huang Hui ; Liu Xinmeng ; Lv Xin
Author_Institution
Sch. of Inf. & Electron., Beijing Inst. of Technol., Beijing, China
fYear
2011
Firstpage
1778
Lastpage
1781
Abstract
The Short-Open-Load-Reciprocal (SOLR) calibration algorithm is firstly introduced. The formulas of scattering parameters solved by values of calibration standards are derived. Then the Guide to the Expression of Uncertainty in Measurement (GUM) compliant Monte-Carlo method is used to evaluate on-wafer scattering parameters measurement uncertainties.
Keywords
Monte Carlo methods; S-parameters; calibration; measurement uncertainty; network analysis; Monte-Carlo analysis; calibration standards; measurement uncertainties; measurement uncertainty; on-wafer short-open-load-reciprocal calibrations; scattering parameters; Calibration; Measurement uncertainty; Monte Carlo methods; Reflection; Scattering parameters; Standards; Uncertainty; Monte-Carlo; On-wafer; Scattering parameters; Uncertainties;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference Proceedings (APMC), 2011 Asia-Pacific
Conference_Location
Melbourne, VIC
Print_ISBN
978-1-4577-2034-5
Type
conf
Filename
6174116
Link To Document