DocumentCode :
1616764
Title :
General compact model for bit-rate limit of electrical interconnects considering DC resistance, skin effect and surface scattering
Author :
Sarvari, Rem ; Naeemi, Azad ; Meindl, James D.
Author_Institution :
Microelectron. Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2004
Firstpage :
163
Lastpage :
165
Abstract :
Compact models are presented for the bit-rate limit of transmission lines using a general form of resistance that for the first time simultaneously considers dc resistance, skin effect, and surface scattering. A conventional approximation that is only valid for fast rising signals is also relaxed. In contrast to previous models, it is shown that the bit-rate limit of a transmission line is not independent of wire perimeter-to-length ratio or scale-invariant. It is also shown that the error of previous models is large (e.g. 80% for bit-rate limit equals reciprocal time of flight) if bit-rate limit is not considerably larger than the reciprocal time-of-flight.
Keywords :
approximation theory; electric resistance; integrated circuit interconnections; skin effect; surface scattering; transmission lines; DC resistance; bit-rate limit; compact model; electrical interconnects; perimeter-to-length ratio; reciprocal time of flight; scale invariance; skin effect; surface scattering; transmission lines; wire length; wire perimeter; Bandwidth; Electric resistance; Equations; Impedance; Integrated circuit interconnections; Scattering; Skin effect; Surface resistance; Transmission lines; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Interconnect Technology Conference, 2004. Proceedings of the IEEE 2004 International
Print_ISBN :
0-7803-8308-7
Type :
conf
DOI :
10.1109/IITC.2004.1345727
Filename :
1345727
Link To Document :
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