DocumentCode :
161694
Title :
Inorganic-organic hybrid resistive switching memory with high uniformity and multilevel operation
Author :
Yefan Liu ; Yimao Cai ; Qiang Li ; Yue Pan ; Zongwei Wang ; Ru Huang
Author_Institution :
Inst. of Microelectron., Peking Univ., Beijing, China
fYear :
2014
fDate :
28-30 April 2014
Firstpage :
1
Lastpage :
2
Abstract :
Poor uniformity of switching parameters has become a main obstacle hindering the real application of single-polymer organic RRAM devices. In this paper, target to solve this issue, an HfOx/parylene hybrid RRAM device has been proposed and experimentally investigated. Measurement data reveals that the switching parameters uniformity of hybrid devices is dramatically improved compared to pure parylene RRAM devices. In addition, hybrid devices show the capability of low-voltage operation (Vset~-2V, Vreset~0.6V) and high on/off current ratio (>1000). Due to the high uniformity and large on/off ratio, the multilevel storage ability with good retention of this hybrid device was experimentally demonstrated.
Keywords :
hafnium compounds; polymers; random-access storage; HfOx; high on-off current ratio; inorganic-organic hybrid resistive switching memory; measurement data; multilevel operation; multilevel storage ability; parylene hybrid RRAM device; single-polymer organic RRAM devices; switching parameter uniformity; Electrodes; Fitting; Hafnium compounds; Ions; Polymers; Resistance; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Technology, Systems and Application (VLSI-TSA), Proceedings of Technical Program - 2014 International Symposium on
Conference_Location :
Hsinchu
Type :
conf
DOI :
10.1109/VLSI-TSA.2014.6839676
Filename :
6839676
Link To Document :
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