Title :
Analysis of random common-mode rejection ratio in op-amps
Author :
Yu, Chong-Gun ; Geiger, Randall L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
Abstract :
One of the important nonideal factors causing op-amp errors is the common-mode rejection ratio (CMRR). The CMRR of CMOS op-amps and its statistical characteristics are thoroughly analyzed. The random and deterministic CMRR of a two-stage CMOS op-amp are derived. The statistical characteristics of the total CMRR are discussed. A definition of the CMRR for processes is given. A sample amplifier has been designed for high-speed and high-precision applications. The simulated performances of the op-amp are shown
Keywords :
CMOS integrated circuits; linear integrated circuits; operational amplifiers; CMOS; deterministic CMRR; high-precision applications; nonideal factors; op-amps; random common-mode rejection ratio; simulated performances; statistical characteristics; Circuit simulation; Computer errors; Degradation; Differential amplifiers; Error analysis; Laboratories; Operational amplifiers; Random variables; Semiconductor device modeling; Voltage;
Conference_Titel :
Circuits and Systems, 1992., Proceedings of the 35th Midwest Symposium on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-0510-8
DOI :
10.1109/MWSCAS.1992.271141
