Title :
Estimation of parametric sensitivity for defects size distribution in VLSI defect/fault analysis
Author :
Blyzniuk, M. ; Kazymyra, I.
Author_Institution :
CAD Dept., Lviv Polytech. Nat. Univ., Ukraine
fDate :
6/24/1905 12:00:00 AM
Abstract :
The parametric sensitivity of defect size distribution in VLSI defect/fault analysis is evaluated. The use of special software tool FIESTA for the computational experiment aimed at estimation of the significance of parameters in expressions approximating the actual defect distribution is considered. The obtained experimental results and their usefulness have been analysed
Keywords :
VLSI; circuit analysis computing; fault diagnosis; integrated circuit reliability; network parameters; FIESTA; VLSI; computational experiment; defect distribution; defect size distribution; defect/fault analysis; parametric sensitivity; software tool; Circuit faults; Data mining; Distributed computing; Fabrication; Manufacturing processes; Probability density function; Software testing; Software tools; System testing; Very large scale integration;
Conference_Titel :
Microelectronics, 2002. MIEL 2002. 23rd International Conference on
Conference_Location :
Nis
Print_ISBN :
0-7803-7235-2
DOI :
10.1109/MIEL.2002.1003317
