DocumentCode
1617335
Title
Estimation of parametric sensitivity for defects size distribution in VLSI defect/fault analysis
Author
Blyzniuk, M. ; Kazymyra, I.
Author_Institution
CAD Dept., Lviv Polytech. Nat. Univ., Ukraine
Volume
2
fYear
2002
fDate
6/24/1905 12:00:00 AM
Firstpage
547
Lastpage
550
Abstract
The parametric sensitivity of defect size distribution in VLSI defect/fault analysis is evaluated. The use of special software tool FIESTA for the computational experiment aimed at estimation of the significance of parameters in expressions approximating the actual defect distribution is considered. The obtained experimental results and their usefulness have been analysed
Keywords
VLSI; circuit analysis computing; fault diagnosis; integrated circuit reliability; network parameters; FIESTA; VLSI; computational experiment; defect distribution; defect size distribution; defect/fault analysis; parametric sensitivity; software tool; Circuit faults; Data mining; Distributed computing; Fabrication; Manufacturing processes; Probability density function; Software testing; Software tools; System testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics, 2002. MIEL 2002. 23rd International Conference on
Conference_Location
Nis
Print_ISBN
0-7803-7235-2
Type
conf
DOI
10.1109/MIEL.2002.1003317
Filename
1003317
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