Title :
Low-Vt devices replacement for domino circuits
Author :
Zhu, Q.K. ; Lingareddy, M.
Author_Institution :
Intel Corp., Castro Valley, CA, USA
fDate :
6/24/1905 12:00:00 AM
Abstract :
An automatic CAD flow was developed to replace devices in domino NMOS stack, CMOS driver and CMOS receiver to the domino circuitry. Input noise thresholds are considered in these devices low-Vt replacement, since the domino circuitry with low-Vt devices increases with the leakage current and prone to logic failures due to the noise. All experiments in this paper were done in a 0.13 μm Intel process
Keywords :
CMOS logic circuits; circuit CAD; integrated circuit noise; leakage currents; microprocessor chips; 0.13 micron; CAD flow; CMOS driver; CMOS receiver; Intel microprocessor; NMOS stack; domino circuit; input noise threshold; leakage current; logic failure; low threshold voltage device; Circuit noise; Clocks; Delay; Driver circuits; Leakage current; Logic devices; MOS devices; Microprocessors; Protection; Rivers;
Conference_Titel :
Microelectronics, 2002. MIEL 2002. 23rd International Conference on
Conference_Location :
Nis
Print_ISBN :
0-7803-7235-2
DOI :
10.1109/MIEL.2002.1003328
