• DocumentCode
    1617605
  • Title

    A novel decoupling capacitor for power integrity of quad flat nonlead (QFN) package

  • Author

    Guan, Sheng-Wei ; Kuo, Chih-Wen ; Wang, Chen-Chao

  • Author_Institution
    Dept. of Electr. Eng., Nat. Sun Yat-sen Univ., Kaohsiung, Taiwan
  • fYear
    2011
  • Firstpage
    1913
  • Lastpage
    1916
  • Abstract
    This paper describes the progressions for power and signal integrity issues on quad flat non-lead (QFN) package. A novel decoupling capacitor is achieved by modifying the footprint of QFN package. The modified footprint is connected to printed circuit board (PCB) power plane and coated the solder mask above. A large decoupling capacitor between power and ground is achieved by thin film solder mask and large size of die pad, which parallel to and decrease the input impedance of power delivery network (PDN) without parasitic effects at low frequency. After 2 GHz, adding more vias can decrease and shift the high impedance caused by equivalent inductance of via to high frequency. This novel decoupling capacitor is fully compatible with PCB process and significantly decreasing the high impedance of PDN.
  • Keywords
    capacitors; electronics packaging; printed circuits; soldering; thin films; PCB process; decoupling capacitor; equivalent inductance; frequency 2 GHz; power delivery network; power integrity; printed circuit board; quad flat nonlead package; thin film solder mask; Bandwidth; Capacitors; Impedance; Inductance; Joining processes; Lead; Packaging; QFN; decoupling capacitor; power integrity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference Proceedings (APMC), 2011 Asia-Pacific
  • Conference_Location
    Melbourne, VIC
  • Print_ISBN
    978-1-4577-2034-5
  • Type

    conf

  • Filename
    6174150