DocumentCode
1617605
Title
A novel decoupling capacitor for power integrity of quad flat nonlead (QFN) package
Author
Guan, Sheng-Wei ; Kuo, Chih-Wen ; Wang, Chen-Chao
Author_Institution
Dept. of Electr. Eng., Nat. Sun Yat-sen Univ., Kaohsiung, Taiwan
fYear
2011
Firstpage
1913
Lastpage
1916
Abstract
This paper describes the progressions for power and signal integrity issues on quad flat non-lead (QFN) package. A novel decoupling capacitor is achieved by modifying the footprint of QFN package. The modified footprint is connected to printed circuit board (PCB) power plane and coated the solder mask above. A large decoupling capacitor between power and ground is achieved by thin film solder mask and large size of die pad, which parallel to and decrease the input impedance of power delivery network (PDN) without parasitic effects at low frequency. After 2 GHz, adding more vias can decrease and shift the high impedance caused by equivalent inductance of via to high frequency. This novel decoupling capacitor is fully compatible with PCB process and significantly decreasing the high impedance of PDN.
Keywords
capacitors; electronics packaging; printed circuits; soldering; thin films; PCB process; decoupling capacitor; equivalent inductance; frequency 2 GHz; power delivery network; power integrity; printed circuit board; quad flat nonlead package; thin film solder mask; Bandwidth; Capacitors; Impedance; Inductance; Joining processes; Lead; Packaging; QFN; decoupling capacitor; power integrity;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference Proceedings (APMC), 2011 Asia-Pacific
Conference_Location
Melbourne, VIC
Print_ISBN
978-1-4577-2034-5
Type
conf
Filename
6174150
Link To Document