• DocumentCode
    1617927
  • Title

    A sub-1V bandgap voltage reference in 32nm FinFET technology

  • Author

    Annema, A.J. ; Veldhorst, P. ; Doornbos, G. ; Nauta, B.

  • Author_Institution
    Univ. of Twente, Enschede
  • fYear
    2009
  • Firstpage
    332
  • Lastpage
    333
  • Abstract
    The bulk CMOS technology is expected to scale down to about 32 nm node and likely the successor would be the FinFET. The FinFET is an ultra-thin body multi-gate MOS transistor with among other characteristics a much higher voltage gain compared to a conventional bulk MOS transistor. Bandgap reference circuits cannot be directly ported from bulk CMOS technologies to SOI FinFET technologies, because both conventional diodes cannot be realized in thin SOI layers and also, area-efficient resistors are not readily available in processes with only metal(lic) gates. In this paper, a sub-1 V bandgap reference circuit is implemented in a 32 nm SOI FinFET technology, with an architecture that significantly reduces the required total resistance value.
  • Keywords
    MOSFET; nanoelectronics; reference circuits; silicon-on-insulator; SOI FinFET technology; Si-JkJk; bandgap voltage reference circuits; bulk CMOS technology; size 32 nm; thin SOI layers; ultra-thin body multigate MOS transistor; CMOS process; CMOS technology; Circuits; Diodes; FinFETs; Immune system; MOSFETs; Photonic band gap; Resistors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference - Digest of Technical Papers, 2009. ISSCC 2009. IEEE International
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    978-1-4244-3458-9
  • Type

    conf

  • DOI
    10.1109/ISSCC.2009.4977443
  • Filename
    4977443