Title :
Investigation of waffle structure SCR for electro-static discharge (ESD) protection
Author :
Qiang Cui ; Shurong Dong ; Yan Han
Author_Institution :
Dept. of ISEE, Zhejiang Univ., Hangzhou, China
Abstract :
The waffle layout SCR-based ESD protection device is presented and analyzed in this paper. This waffle structure with symmetrical layout is designed to generate more current paths to distribute ESD currents better. TLP I-V measurement results show that, the stand-alone waffle layout SCR costs only 39 percent silicon area of conventional stripe layout SCR, but can achieve better ESD robustness. Results also show that the trigger voltage and current handling ability of waffle layout SCR can be adjustable to meet different operating demands by changing the device dimensions.
Keywords :
electrostatic discharge; thyristors; ESD protection device; TLP I-V measurement; electro-static discharge protection; symmetrical layout; waffle layout SCR; waffle structure; Cathodes; Current measurement; Electrostatic discharges; Layout; Thyristors; Trigger circuits; Voltage measurement; ESD Robustness; Electro-static discharge (ESD); Silicon-controlled rectifier (SCR); Symmetrical layout;
Conference_Titel :
Electron Devices and Solid State Circuit (EDSSC), 2012 IEEE International Conference on
Conference_Location :
Bangkok
Print_ISBN :
978-1-4673-5694-7
DOI :
10.1109/EDSSC.2012.6482791
