DocumentCode :
1618304
Title :
Initiation mechanism of electrical tree under alternating stress-electron impact or UV photo-degradation?
Author :
Shimizu, N. ; Takahashi, T. ; Iemura, S.
Author_Institution :
Meijo Univ., Nagoya, Japan
fYear :
2001
fDate :
6/23/1905 12:00:00 AM
Firstpage :
423
Lastpage :
426
Abstract :
The formation process of the microcavity is important for understanding the initiation phase of an electrical tree. Two models have been proposed for the mechanism of microcavity formation and electrical tree initiation. One is the electron impact model. In this model, electrons injected from a metal electrode or conducting particle are accelerated in the polymer free volume by high electric field. These hot electrons collide with polymer chains to break them. The other is the photo-degradation model. Electroluminescence (EL) is a photoemission phenomenon observed before tree initiation. In this model, ultraviolet (UV) components of electroluminescence cause polymer degradation. In this paper, we compare these two models
Keywords :
XLPE insulation; charge injection; electroluminescence; hot carriers; polymers; trees (electrical); ultraviolet radiation effects; UV photo-degradation; alternating stress; conducting particle; electrical tree; electroluminescence; electron impact; electron impact model; high electric field; hot electrons; initiation mechanism; metal electrode; microcavity; polymer degradation; Dielectrics and electrical insulation; Electroluminescence; Electromagnetic wave absorption; Electrons; Partial discharges; Plastic insulation; Polymers; Power system reliability; Stress; Trees - insulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid Dielectrics, 2001. ICSD '01. Proceedings of the 2001 IEEE 7th International Conference on
Conference_Location :
Eindhoven
Print_ISBN :
0-7803-6352-3
Type :
conf
DOI :
10.1109/ICSD.2001.955681
Filename :
955681
Link To Document :
بازگشت