• DocumentCode
    1618304
  • Title

    Initiation mechanism of electrical tree under alternating stress-electron impact or UV photo-degradation?

  • Author

    Shimizu, N. ; Takahashi, T. ; Iemura, S.

  • Author_Institution
    Meijo Univ., Nagoya, Japan
  • fYear
    2001
  • fDate
    6/23/1905 12:00:00 AM
  • Firstpage
    423
  • Lastpage
    426
  • Abstract
    The formation process of the microcavity is important for understanding the initiation phase of an electrical tree. Two models have been proposed for the mechanism of microcavity formation and electrical tree initiation. One is the electron impact model. In this model, electrons injected from a metal electrode or conducting particle are accelerated in the polymer free volume by high electric field. These hot electrons collide with polymer chains to break them. The other is the photo-degradation model. Electroluminescence (EL) is a photoemission phenomenon observed before tree initiation. In this model, ultraviolet (UV) components of electroluminescence cause polymer degradation. In this paper, we compare these two models
  • Keywords
    XLPE insulation; charge injection; electroluminescence; hot carriers; polymers; trees (electrical); ultraviolet radiation effects; UV photo-degradation; alternating stress; conducting particle; electrical tree; electroluminescence; electron impact; electron impact model; high electric field; hot electrons; initiation mechanism; metal electrode; microcavity; polymer degradation; Dielectrics and electrical insulation; Electroluminescence; Electromagnetic wave absorption; Electrons; Partial discharges; Plastic insulation; Polymers; Power system reliability; Stress; Trees - insulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid Dielectrics, 2001. ICSD '01. Proceedings of the 2001 IEEE 7th International Conference on
  • Conference_Location
    Eindhoven
  • Print_ISBN
    0-7803-6352-3
  • Type

    conf

  • DOI
    10.1109/ICSD.2001.955681
  • Filename
    955681