DocumentCode
1618697
Title
Delta-sigma A/D convertor with reduced sensitivity to op amp noise and gain
Author
Hurst, Paul J. ; Levinson, Roger A.
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., California Univ., Davis, CA, USA
fYear
1989
Firstpage
254
Abstract
Switched-capacitor techniques are presented which compensate for noise and finite-gain limitation in second-order DSMs (delta-sigma modulators). Hand analysis and computer simulations show great promise for these new techniques, and preliminary tests conclusively show that the gain compensation is extremely promising, especially for low-power supply voltages. Test ICs containing the DSMs were fabricated in a 3-μm digital CMOS process. Class AB op amps were used in the DSMs; a low-gain, higher-speed version was used in the gain-compensated circuit. Results from preliminary tests show that the delta-sigma modulators presented are functional, but design and modeling errors combined with widely varying process parameters severely limited the op amp performance, causing the op amp settling time to be much longer than expected
Keywords
CMOS integrated circuits; analogue-digital conversion; compensation; operational amplifiers; switched capacitor networks; 3 micron; A/D convertor; ADC; SC techniques; class AB amplifier; delta-sigma modulators; design errors; digital CMOS process; finite-gain limitation; gain compensation; low-power supply voltages; modeling errors; monolithic IC; noise compensation; op amp gain sensitivity; op amp noise sensitivity; op amp settling time; process parameters; sensitivity reduction; switched capacitor; Circuit noise; Converters; Delta-sigma modulation; Noise reduction; Noise shaping; Operational amplifiers; Quantization; Signal to noise ratio; Switching circuits; Transfer functions;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1989., IEEE International Symposium on
Conference_Location
Portland, OR
Type
conf
DOI
10.1109/ISCAS.1989.100339
Filename
100339
Link To Document