Title :
Histogram-based distortion and gain tracking testing of an 8-bit PCM mixed analog-digital IC chip
Author :
Toner, M.F. ; Roberts, G.W.
Author_Institution :
Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Que., Canada
Abstract :
The effective number of bits of a linear analog-to-digital converter (ADC) can be computed using the code density histogram method. The technique is adapted to test an oversampling or sigma-delta (ΣΔ) converter. It is assumed that the device under test includes a ΣΔ modulator, a decimator, and a μ-law compressor. The analog stimulus to the device under test is supplied by a precision signal generator, and the code density histogram of the 8-b μ-law compressed output of the ADC is analyzed to determine whether the converter is performing within its specifications. Simulation results which were obtained using a very simple model for the ADC and additive white Gaussian noise are presented
Keywords :
analogue-digital conversion; mixed analogue-digital integrated circuits; pulse-code modulation; white noise; μ-law compressor; ADC; PCM mixed analog-digital IC chip; additive white Gaussian noise; analog-to-digital converter; code density histogram method; decimator; gain tracking testing; oversampling; precision signal generator; sigma-delta convertor; Analog integrated circuits; Analog-digital conversion; Analog-digital integrated circuits; Circuit testing; Costs; Digital signal processing; Integrated circuit testing; Phase change materials; Production; Signal to noise ratio;
Conference_Titel :
Circuits and Systems, 1992., Proceedings of the 35th Midwest Symposium on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-0510-8
DOI :
10.1109/MWSCAS.1992.271214
