DocumentCode :
1618820
Title :
Design for testability techniques in switched-capacitor circuits
Author :
Rueda, A. ; Huertas, J.L. ; Vázquez, D.
Author_Institution :
Dpto. de Diseno Analogico, Sevilla Univ., Spain
fYear :
1992
Firstpage :
752
Abstract :
A way to incorporate design for test methodology into switched-capacitor filters is presented. It falls into what is known in digital circuits as a voting-based scheme. The basic architecture uses some additional circuitry for providing extra capabilities for both off- and on-line test. The approach uses a comparison (voting) mechanism to indicate whether or not two copies of a filter element (a biquad, for instance) have a similar response during their actual operation. The design of two examples is included to assess the potential usefulness of this new approach
Keywords :
active filters; design for testability; switched capacitor filters; a biquad; design for test methodology; filter element; switched-capacitor circuits; switched-capacitor filters; voting-based scheme; Aggregates; Circuit testing; Design for testability; Digital control; Digital filters; Digital systems; Signal design; Switched capacitor circuits; Switches; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 1992., Proceedings of the 35th Midwest Symposium on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-0510-8
Type :
conf
DOI :
10.1109/MWSCAS.1992.271216
Filename :
271216
Link To Document :
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