• DocumentCode
    1619213
  • Title

    Research on nonlinearity of closed-loop capacitive accelerometer resulting from time-division force feedback

  • Author

    Zhao Meng ; Huang Jingqing ; Zhang Tingting ; Hong Lichen ; Zhang Yacong ; Lu Wengao ; Chen Zhongjian

  • Author_Institution
    Dept. of Microelectron., Peking Univ., Beijing, China
  • fYear
    2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Linearity which determines the system precision is one of the main performance parameters of accelerometers especially the wide-range ones. The design parameters of the interface circuit have a great effect on the linearity of the accelerometer system utilizing time-division force feedback (TDFF). In this paper, the nonlinearity resulting from time-division force feedback is discussed and the formulae reflecting the relationship between the system linearity and the design parameters are derived, which can help the designers to adjust timing parameters according to the linearity demand. The theory is verified by Matlab/Simulink numerical simulation. Based on the design formulae presented, a ±30 g closed-loop TDFF capacitive micro-accelerometer is implemented in 0.35 μm high-voltage CMOS process, which operates under ±6.5 V supply and achieves linearity of 99.72% in the self-test mode.
  • Keywords
    CMOS integrated circuits; accelerometers; capacitive sensors; closed loop systems; force feedback; microsensors; numerical analysis; CMOS process; Matlab; Simulink; TDFF; capacitive microaccelerometer; closed loop capacitive accelerometer; design parameter; interface circuit; nonlinearity; numerical simulation; size 0.35 mum; system linearity; time division force feedback; Acceleration; Accelerometers; Built-in self-test; Force feedback; Linearity; MATLAB; Matlab/Simulink model; capacitive accelerometer; closed-loop; interface circuit; linearity; time-division force feedback;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Solid State Circuit (EDSSC), 2012 IEEE International Conference on
  • Conference_Location
    Bangkok
  • Print_ISBN
    978-1-4673-5694-7
  • Type

    conf

  • DOI
    10.1109/EDSSC.2012.6482838
  • Filename
    6482838