Title :
A systematic method for determining soft-failure robustness of a subsystem
Author :
Orr, Benjamin ; Maheshwari, Pushp ; Gossner, Harald ; Pommerenke, David ; Stadler, Wolfgang
Author_Institution :
EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
Abstract :
A systematic method for evaluating soft fail robustness of a DUT subsystem is presented and demonstrated on a camera MIPI interface. Two different mobile phone platforms are studied under TLP injection while various methods for extracting failure thresholds and localization are applied. The root cause for the soft-failure threshold discrepancy is left for future work.
Keywords :
electrostatic discharge; mobile radio; reliability; DUT subsystem; TLP injection; camera MIPI interface; mobile phone; soft-failure robustness; soft-failure threshold discrepancy; Cameras; Probes; Pulse measurements; Robustness; Software; Testing; Voltage measurement;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2013 35th
Conference_Location :
Las Vegas, NV
