• DocumentCode
    1619510
  • Title

    Powered system-level conductive TLP probing method for ESD/EMI hard fail and soft fail threshold evaluation

  • Author

    Schwingshackl, Thomas ; Orr, Benjamin ; Willemen, Joost ; Simburger, Werner ; Gossner, Harald ; Bosch, Wolfgang ; Pommerenke, David

  • Author_Institution
    Infineon Technol. AG, Neubiberg, Germany
  • fYear
    2013
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    In this paper an advanced system-level TLP probing technique is presented to evaluate the ESD and EMI performance of a powered system applicable to high speed interfaces. It allows to detect hardware and software fail thresholds to assess the performance of an ESD/EMI protection solution. The method is demonstrated on a Intel mobile phone reference platform.
  • Keywords
    electromagnetic interference; electrostatic discharge; hardware-software codesign; ESD/EMI protection solution; Intel mobile phone reference platform; fail thresholds; hard fail; high speed interfaces; soft fail; system-level conductive TLP probing method; threshold evaluation; Capacitance; Current measurement; Electrostatic discharges; Impedance; Insertion loss; Probes; Transmission line measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2013 35th
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0739-5159
  • Type

    conf

  • Filename
    6635924
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1619510