Title :
Proceedings of IEEE Bipolar/BiCMOS Circuits and Technology Meeting
Abstract :
The following topics were dealt with: analog circuits; high-performance BiCMOS; IC modelling; high-speed digital circuits; power and thermal effects; characterization; device simulation; stres and reliability; process integration
Keywords :
bipolar integrated circuits; BiCMOS technology; IC modelling; analog circuits; bipolar technology; characterization; device simulation; high-performance BiCMOS; high-speed digital circuits; power effects; process integration; stres; thermal effects;
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting,1994., Proceedings of the 1994
Conference_Location :
Minneapolis, MN, USA
Print_ISBN :
0-7803-1316-X
DOI :
10.1109/BIPOL.1994.587843
