Title :
High fan-in circuit design
Author :
Clark, Lawrence T. ; Taylor, Gregory F.
Author_Institution :
Intel Corp., USA
Abstract :
A review of high fan-in circuit design in contemporary logic technologies is presented. This is followed by a description of a BiNMOS circuit structure which allows the construction of large fan-in, dynamic logical NAND or OR functions. Power and reliability considerations such as BJT reverse Vbe and MOS hot electron protection are included. Application of the circuit in the 3.3 V, 100 MHz, implementation of the Pentium Microprocessor on a 0.6 mm BiNMOS process is discussed
Keywords :
BiCMOS integrated circuits; Capacitance; Circuit noise; Circuit synthesis; Degradation; Delay; Fault location; MOS devices; Microprocessors; Protection;
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting,1994., Proceedings of the 1994
Conference_Location :
Minneapolis, MN
Print_ISBN :
0-7803-1316-X
DOI :
10.1109/BIPOL.1994.587847
