• DocumentCode
    1619780
  • Title

    High fan-in circuit design

  • Author

    Clark, Lawrence T. ; Taylor, Gregory F.

  • Author_Institution
    Intel Corp., USA
  • fYear
    1994
  • Firstpage
    27
  • Lastpage
    32
  • Abstract
    A review of high fan-in circuit design in contemporary logic technologies is presented. This is followed by a description of a BiNMOS circuit structure which allows the construction of large fan-in, dynamic logical NAND or OR functions. Power and reliability considerations such as BJT reverse Vbe and MOS hot electron protection are included. Application of the circuit in the 3.3 V, 100 MHz, implementation of the Pentium Microprocessor on a 0.6 mm BiNMOS process is discussed
  • Keywords
    BiCMOS integrated circuits; Capacitance; Circuit noise; Circuit synthesis; Degradation; Delay; Fault location; MOS devices; Microprocessors; Protection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Bipolar/BiCMOS Circuits and Technology Meeting,1994., Proceedings of the 1994
  • Conference_Location
    Minneapolis, MN
  • Print_ISBN
    0-7803-1316-X
  • Type

    conf

  • DOI
    10.1109/BIPOL.1994.587847
  • Filename
    587847
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1619780