Title :
System level EOS case studies not due to excessive voltages
Author :
Wong, Rita ; Shi-Jie Wen ; Fung, Rita ; Le, Paul
Author_Institution :
Cisco Syst. Inc., San Jose, CA, USA
Abstract :
EOS has been a dominant failure mode. Recent efforts to determine root causes have focused on voltages that have exceeded a safe operating limit. Case studies will be presented that show EOS failures where the root cause is not excessive voltages.
Keywords :
failure analysis; integrated circuit reliability; integrated circuit testing; EOS failures; dominant failure mode; electrical over stress; safe operating limit; system level EOS; Clamps; Earth Observing System; Electrostatic discharges; Failure analysis; Heating; Metals; Power supplies;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2013 35th
Conference_Location :
Las Vegas, NV
