Title :
Advanced modelling of distortion effects in bipolar transistors using the Mextram model
Author :
de Vreede, L.C.N. ; de Graaff, H.C. ; Mouthaan, K. ; de Kok, M. ; Tauritz, J.L. ; Baets, R.G.F.
Author_Institution :
Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
Abstract :
Modelling of distortion effects in bipolar transistors due to the onset of quasi saturation is considered. Computational results obtained using Mextram and Gummel Poon models as implemented in a harmonic balance simulator are compared with measured results
Keywords :
bipolar transistors; Gummel Poon model; Mextram model; bipolar transistors; distortion; harmonic balance simulator; quasi saturation; Bipolar transistors; Circuit testing; Distortion measurement; Electrical resistance measurement; Frequency; Integrated circuit modeling; Laboratories; Resistors; Semiconductor process modeling; Voltage;
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting,1994., Proceedings of the 1994
Conference_Location :
Minneapolis, MN
Print_ISBN :
0-7803-1316-X
DOI :
10.1109/BIPOL.1994.587854
