• DocumentCode
    1619980
  • Title

    Investigation of product burn-in failures due to powered NPN bipolar latching of active MOSFET rail clamps

  • Author

    Ruth, Scott ; Miller, James W. ; Gerdemann, Alex ; Stockinger, Michael ; Etherton, Melanie ; Moosa, Mohamed ; Dobbin, Allan ; Mertens, Robert ; Meng, Kuo-Hsuan ; Rosenbaum, Elyse ; Colombo, Pietro ; Cordoni, Martina ; Guitard, Nicolas

  • Author_Institution
    Freescale Semicond., Austin, TX, USA
  • fYear
    2013
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    A product utilizing 5V RC clamps suffered EOS damage during BI due to marginal Vhold of the clamp NMOS. Powered TLP was used to mimic BI noise events and to explain clamp response across a range of starting Vsupply levels. Alternate clamp configurations were explored to improve Vhold.
  • Keywords
    MOSFET; clamps; electrostatic discharge; EOS damage; NPN bipolar latching; RC clamps; active MOSFET; clamp NMOS; clamp response; mimic BI noise events; product burn-in failures; rail clamps; voltage 5 V; Bismuth; Clamps; Current measurement; Electrostatic discharges; Layout; MOS devices; Rails;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2013 35th
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0739-5159
  • Type

    conf

  • Filename
    6635940
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1619980