Title :
Investigation of product burn-in failures due to powered NPN bipolar latching of active MOSFET rail clamps
Author :
Ruth, Scott ; Miller, James W. ; Gerdemann, Alex ; Stockinger, Michael ; Etherton, Melanie ; Moosa, Mohamed ; Dobbin, Allan ; Mertens, Robert ; Meng, Kuo-Hsuan ; Rosenbaum, Elyse ; Colombo, Pietro ; Cordoni, Martina ; Guitard, Nicolas
Author_Institution :
Freescale Semicond., Austin, TX, USA
Abstract :
A product utilizing 5V RC clamps suffered EOS damage during BI due to marginal Vhold of the clamp NMOS. Powered TLP was used to mimic BI noise events and to explain clamp response across a range of starting Vsupply levels. Alternate clamp configurations were explored to improve Vhold.
Keywords :
MOSFET; clamps; electrostatic discharge; EOS damage; NPN bipolar latching; RC clamps; active MOSFET; clamp NMOS; clamp response; mimic BI noise events; product burn-in failures; rail clamps; voltage 5 V; Bismuth; Clamps; Current measurement; Electrostatic discharges; Layout; MOS devices; Rails;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2013 35th
Conference_Location :
Las Vegas, NV
