Title :
Auditing of a Class 0 facility
Author :
Iben, Icko Eric Timothy ; Lam, Michelle ; Mohammadnejad, Milad ; Paniagua, Bill
Author_Institution :
Almaden Res. Center, IBM Co., San Jose, CA, USA
Abstract :
Auditing a manufacturing facility which assembles devices with magnetoresistive readers requires finding and eliminating sources of both ESD and EOS pulses at levels below 1 V. A Discharge Event Audit tool was made to observe ESD and EOS pulses occur in tape head manufacturing line using MR readers.
Keywords :
electrostatic discharge; magnetoresistive devices; production facilities; EOS pulses; ESD pulses; MR readers; auditing; class 0 facility; discharge event audit tool; magnetoresistive readers; manufacturing facility; tape head manufacturing line; Current measurement; Earth Observing System; Electrostatic discharges; Pulse measurements; Resistors; Voltage measurement; Wires;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2013 35th
Conference_Location :
Las Vegas, NV
