• DocumentCode
    1620059
  • Title

    Design and control of tapping mode atomic force microscope in liquid utilizing optical pickup system

  • Author

    Hu, Wan-Lin ; Hung, Shao-Kang ; Fu, Li-Chen

  • Author_Institution
    Electr. Eng. Dept., Nat. Taiwan Univ., Taipei
  • fYear
    2008
  • Firstpage
    783
  • Lastpage
    788
  • Abstract
    In this work, we propose a fluid tapping mode atomic force microscopy (AFM) implemented by a DVD pickup head. The use of DVD pickup head minimizes the volume of the hardware system, and thus reduces the measurement error caused by heat expansion. In order to realize the system mentioned above, we design a Q-controller to modulate the interaction force between the tip and the sample. Increasing the quality factor will overcome the problem with high damping ratio in the fluid which makes the probe hard to oscillate. Because of the reduction of the tip-sample force, the sample surface will not be hurt by the tip. Therefore, we can use the AFM to scan soft sample, and obtain more realistic topography. Traditionally, people use proportion-integration controller to control the system. Users need to tune this kind of controller manually, and hence the quality of the scan images is highly related to userspsila experiences. To overcome this problem, we design an adaptive sliding-mode controller to improve the scanning capability and robustness. For testing the system capability, we will have a series of numerical simulations.
  • Keywords
    PI control; Q-factor; adaptive control; atomic force microscopy; control system synthesis; digital versatile discs; variable structure systems; DVD pickup head; Q-controller; adaptive sliding-mode controller; fluid tapping mode atomic force microscopy; heat expansion; liquid utilizing optical pickup system; proportion-integration controller; quality factor; Atom optics; Atomic force microscopy; Atomic measurements; Control systems; DVD; Force control; Optical control; Optical design; Optical microscopy; Sliding mode control; Q-control; adaptive sliding-mode control; atomic force microscope (AFM); tapping mode;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control, Automation and Systems, 2008. ICCAS 2008. International Conference on
  • Conference_Location
    Seoul
  • Print_ISBN
    978-89-950038-9-3
  • Electronic_ISBN
    978-89-93215-01-4
  • Type

    conf

  • DOI
    10.1109/ICCAS.2008.4694604
  • Filename
    4694604