Title :
Design and test in the universities
Author :
Al-Arian, Sami A.
Author_Institution :
Dept. of Comput. Sci. & Eng., South Florida Univ., Tampa, FL, USA
Abstract :
It is argued that a broad-based VLSI curriculum should be established in the university. In conjunction with theoretical teaching, facilities that include an integrated design and test environment, CAD tools, and ATE (automatic test equipment) should be provided. A possible program might be directed toward the computer (or electrical) engineering degree with emphasis on VLSI design and testing. The areas that might be included in such a program are design and architecture, device physics and technology, integrated circuits, testing and fault tolerance, CAD tools, algorithms and applications, and processing techniques
Keywords :
VLSI; automatic test equipment; automatic testing; educational courses; electrical engineering; integrated circuit testing; ATE; CAD tools; VLSI curriculum; VLSI design; algorithms; automatic test equipment; fault tolerance; integrated design and test environment; teaching; universities; Algorithm design and analysis; Automatic test equipment; Automatic testing; Circuit testing; Design automation; Design engineering; Education; Educational institutions; Electrical engineering computing; Very large scale integration;
Conference_Titel :
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location :
Washington, DC
DOI :
10.1109/TEST.1989.82301
