Title :
CDM tester properties as deduced from waveforms
Author :
Maloney, Timothy J. ; Jack, Nathan
Author_Institution :
Intel Corp., Santa Clara, CA, USA
Abstract :
Two-pole RLC models, matching peak current and charge under the first current peak, are shown to fit CDM waveforms well, as they target features that cause device failure. RLC properties of ferrites, air sparks, varying dielectric and other tester elements become clear and point us to a revised CDM test standard.
Keywords :
RLC circuits; electronics packaging; electrostatic discharge; equivalent circuits; test equipment; CDM tester; air sparks; charged device model test; current peak; device failure; ferrites RLC properties; two pole RLC model; Dielectrics; Electronics packaging; Inductance; Market research; Resistance; Sparks; Standards;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2013 35th
Conference_Location :
Las Vegas, NV
