Title :
Predictive modeling of peak discharge current during charged device model test of microelectronic components
Author :
Shukla, Vineeta ; Boselli, G. ; Dissegna, Mariano ; Duvvury, Charvaka ; Sankaralingam, Rajkumar ; Rosenbaum, Elyse
Author_Institution :
Univ. of Illinois at Urbana Champaign, Urbana, IL, USA
Abstract :
This work presents a computationally efficient methodology to predict the peak CDM discharge current for a given pre-charge voltage. The methodology is applied to a variety of IC components in different types of packages; the peak current values obtained from simulations agree well with those obtained from FICDM measurements.
Keywords :
charged currents; discharges (electric); electric current measurement; integrated circuit testing; FICDM measurement; IC components; charged device model test; microelectronic components; peak CDM discharge current; peak current values; peak discharge current; precharge voltage; predictive modeling; Bandwidth; Capacitance; Current measurement; Dielectrics; Discharges (electric); Integrated circuit modeling; Substrates;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2013 35th
Conference_Location :
Las Vegas, NV
