DocumentCode :
1620441
Title :
The push for test in universities
Author :
Bouldin, Donald W.
Author_Institution :
Electr. & Comput. Eng., Tennessee Univ., Knoxsville, TN, USA
fYear :
1989
Firstpage :
246
Abstract :
It is noted that the increased use of application-specific integrated circuits in products is increasing the demand for courses in VLSI. It is argued that design for testability should be an integral part of these project courses. The results of an IEEE Computer Society survey of universities teaching VLSI are presented, along with some recommendations for facilitating the process of emphasizing test in curricula. Specifically, it is recommended that VLSI testing in universities be facilitated by having public domain-integrated CAD tools that support automatic test pattern generation and built-in self-test, more textbooks which incorporate design for testability, increased industrial and governmental equipment support, standardized design frames and test fixtures that can be share among projects and organizations, and additional publicity to raise the awareness level for these needs
Keywords :
CAD; VLSI; application specific integrated circuits; automatic test equipment; automatic testing; educational courses; integrated circuit testing; ASIC; CAD tools; IC testing; VLSI; application-specific integrated circuits; automatic test pattern generation; built-in self-test; design for testability; government support; industrial support; project courses; standardized design frames; textbooks; universities; Application specific integrated circuits; Automatic test pattern generation; Automatic testing; Circuit testing; Computer Society; Design automation; Design for testability; Education; Educational institutions; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location :
Washington, DC
Type :
conf
DOI :
10.1109/TEST.1989.82302
Filename :
82302
Link To Document :
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