DocumentCode
1620587
Title
Noninvasive voltage measurement through an on-chip test structure [IC testing]
Author
Dai, Hong ; Choo, Michael ; Starzyk, Janusz A.
Author_Institution
Dept. of Electr. Eng., Lafayette Coll., Easton, PA, USA
fYear
1992
Firstpage
340
Abstract
A method to evaluate internal voltages through a built-in test structure is presented. Multiplexers are used to increase accessibility. The test structure does not affect normal operation of the circuit. Individual subcircuits can be tested selectively based on evaluated internal voltages
Keywords
application specific integrated circuits; built-in self test; integrated circuit testing; voltage measurement; IC testing; VLSI; analogue circuits; built-in test structure; digital subcircuits; internal voltages; mixed signal testing; multiplexer test structure; noninvasive voltage measurement; on-chip test structure; Analog circuits; Built-in self-test; Circuit testing; Integrated circuit testing; Large-scale systems; MOS capacitors; MOSFET circuits; Multiplexing; Performance evaluation; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1992., Proceedings of the 35th Midwest Symposium on
Conference_Location
Washington, DC
Print_ISBN
0-7803-0510-8
Type
conf
DOI
10.1109/MWSCAS.1992.271291
Filename
271291
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