Title :
Noninvasive voltage measurement through an on-chip test structure [IC testing]
Author :
Dai, Hong ; Choo, Michael ; Starzyk, Janusz A.
Author_Institution :
Dept. of Electr. Eng., Lafayette Coll., Easton, PA, USA
Abstract :
A method to evaluate internal voltages through a built-in test structure is presented. Multiplexers are used to increase accessibility. The test structure does not affect normal operation of the circuit. Individual subcircuits can be tested selectively based on evaluated internal voltages
Keywords :
application specific integrated circuits; built-in self test; integrated circuit testing; voltage measurement; IC testing; VLSI; analogue circuits; built-in test structure; digital subcircuits; internal voltages; mixed signal testing; multiplexer test structure; noninvasive voltage measurement; on-chip test structure; Analog circuits; Built-in self-test; Circuit testing; Integrated circuit testing; Large-scale systems; MOS capacitors; MOSFET circuits; Multiplexing; Performance evaluation; Voltage measurement;
Conference_Titel :
Circuits and Systems, 1992., Proceedings of the 35th Midwest Symposium on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-0510-8
DOI :
10.1109/MWSCAS.1992.271291
