• DocumentCode
    1620613
  • Title

    On the Investigation of Path Preference in End-to-End Network Measurements

  • Author

    Jin, Xing ; Xia, Qiuyan ; Chan, S. H Gary

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Hong Kong Univ. of Sci. & Technol., Hong Kong
  • fYear
    2008
  • Firstpage
    2091
  • Lastpage
    2095
  • Abstract
    Overlay applications have used various tools to measure path properties in order to construct efficient overlay networks. Typical examples include delay measurement, connectivity measurement and residual bandwidth measurement. While different tools have different measurement targets, it is difficult to design general criterion for selecting paths to measure. In this paper, we study path properties and figure out some simple rules for path selection in measurements. We first examine the relationship between path delay and residual bandwidth. Our measurement results indicate that short paths often have high residual bandwidth. We then impose high preference on short paths in traceroute measurements. The results show that traceroute measurements with path preference achieve comparable inference efficiency and much lower overhead as compared to traditional traceroute measurements. Our study suggests that we can preferentially select short paths to measure. This can fulfill various requirements on path properties.
  • Keywords
    computer networks; delays; telecommunication network routing; connectivity measurement; delay measurement; end-to-end network measurements; overlay networks; path delay; path preference; residual bandwidth measurement; traceroute measurements; Bandwidth; Communications Society; Computer science; Current measurement; Delay estimation; Extraterrestrial measurements; Network topology; Stress measurement; Telecommunication traffic; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications, 2008. ICC '08. IEEE International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-2075-9
  • Electronic_ISBN
    978-1-4244-2075-9
  • Type

    conf

  • DOI
    10.1109/ICC.2008.401
  • Filename
    4533437