Title :
Design assurance in a university setting
Author_Institution :
Rensselaer Polytech. Inst., Troy, NY, USA
Abstract :
It is argued that VLSI design assurance in a university setting requires developing an environment in which a multiplicity of reliable designs can be produced by inexperienced designers at minimal costs. Two issues in design verification and testing are examined: the first relates to design for testability; the second is the practical verification of designs once they are implemented in silicon. It is concluded that as problems associated with design assurance are solved, the results should be of value to a broader community and especially to ASIC (application-specific integrated circuit) designers
Keywords :
VLSI; application specific integrated circuits; circuit CAD; elemental semiconductors; integrated circuit testing; silicon; teaching; ASIC; IC testing; Si; VLSI design assurance; application-specific integrated circuit; design for testability; design verification; university; Application specific integrated circuits; Assembly systems; Design automation; Electronic equipment testing; Process design; Programmable logic arrays; Routing; Silicon; Standards development; Very large scale integration;
Conference_Titel :
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location :
Washington, DC
DOI :
10.1109/TEST.1989.82303