• DocumentCode
    1620639
  • Title

    Design assurance in a university setting

  • Author

    Rose, Ken

  • Author_Institution
    Rensselaer Polytech. Inst., Troy, NY, USA
  • fYear
    1989
  • Firstpage
    247
  • Lastpage
    248
  • Abstract
    It is argued that VLSI design assurance in a university setting requires developing an environment in which a multiplicity of reliable designs can be produced by inexperienced designers at minimal costs. Two issues in design verification and testing are examined: the first relates to design for testability; the second is the practical verification of designs once they are implemented in silicon. It is concluded that as problems associated with design assurance are solved, the results should be of value to a broader community and especially to ASIC (application-specific integrated circuit) designers
  • Keywords
    VLSI; application specific integrated circuits; circuit CAD; elemental semiconductors; integrated circuit testing; silicon; teaching; ASIC; IC testing; Si; VLSI design assurance; application-specific integrated circuit; design for testability; design verification; university; Application specific integrated circuits; Assembly systems; Design automation; Electronic equipment testing; Process design; Programmable logic arrays; Routing; Silicon; Standards development; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
  • Conference_Location
    Washington, DC
  • Type

    conf

  • DOI
    10.1109/TEST.1989.82303
  • Filename
    82303