Title :
NMOS current mirror thermal analysis
Author :
Jablonski, Michal ; Kos, Andrzej ; De Mey, Gilbert
Author_Institution :
Fac. of Electr. Eng., AGH-Univ. of Sci. & Technol., Krakow, Poland
Abstract :
This report focuses on the problem of temperature influence on one of the most basic analog circuitry subsystem- a current mirror, based on MOSFET transistors. Basic and cascode current mirrors are put to a simulation test using a SPICE model. The influence of different temperature distributions on output current precision and output resistance are investigated.
Keywords :
MOS integrated circuits; analogue integrated circuits; current mirrors; thermal analysis; MOSFET transistors; NMOS current mirror thermal analysis; SPICE model; analog circuitry subsystem; output current precision; output resistance; simulation test; temperature distributions; temperature influence; Heating; Integrated circuits; Mirrors; Resistance; Temperature distribution; Transistors; NMOS; current mirror; temperature gradients; thermal analysis;
Conference_Titel :
Mixed Design of Integrated Circuits and Systems (MIXDES), 2010 Proceedings of the 17th International Conference
Conference_Location :
Warsaw
Print_ISBN :
978-1-4244-7011-2
Electronic_ISBN :
978-83-928756-4-2
