DocumentCode :
1621006
Title :
Analysis of fault locating signals for high-impedance grounded systems
Author :
Baldwin, Thomas ; Renovich, Frank
Author_Institution :
FAMU, Florida State Univ., Tallahassee, FL, USA
Volume :
3
fYear :
2001
Firstpage :
1823
Abstract :
High-resistance grounding and ungrounded power systems have many advantages, including continuous operation after a ground fault. However, locating ground faults is inherently difficult and is a major disadvantage with these systems. The problem stems from the lack of a good signal, such as a large fault current, that points to the fault. Classical search methods use injected locating signals, but they have shortcomings with intermittent faults, multiple ´same-phase´ faults, and closed loop/mesh power networks. New location methods attempt to overcome these previous problems by providing signals that can be used during system operation and with microprocessor-based detectors. This paper explores some of the key technical issues surrounding locating signals. Of concern are the signal flows through the power network including the uniqueness of the signal path. Other issues that are addressed, are signal levels and power requirement, network impedances, and the impact of grounding capacitances and grounding resistances that divert the locating signal.
Keywords :
earthing; electric impedance; fault location; power system protection; signal processing; closed loop/mesh power networks; fault locating signals analysis; ground fault location; grounding capacitances; grounding resistances; high-impedance grounded systems; high-resistance grounding power systems; injected locating signals; intermittent faults; locating signal diversion; microprocessor-based detectors; multiple same-phase faults; network impedances; power requirement; search methods; signal flows; signal levels; technical issues; ungrounded power systems; Capacitance; Electric resistance; Electrical fault detection; Fault currents; Fault detection; Fault location; Grounding; Impedance; Power system faults; Signal analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 2001. Thirty-Sixth IAS Annual Meeting. Conference Record of the 2001 IEEE
Conference_Location :
Chicago, IL, USA
ISSN :
0197-2618
Print_ISBN :
0-7803-7114-3
Type :
conf
DOI :
10.1109/IAS.2001.955779
Filename :
955779
Link To Document :
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